Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
- Publisher
- Springer/Sci-Tech/Trade
- Initial publish date
- Apr 2006
- Category
- Physics
-
Hardback
- ISBN
- 9780387258003
- Publish Date
- Apr 2006
- List Price
- $196.5
Add it to your shelf
Where to buy it
Out of print
This edition is not currently available in bookstores. Check your local library or search for used copies at Abebooks.
Description
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences.Physical Principles of Electron Microscopyprovides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.